Microscopy and Microanalysis Volume 18, Number 6, 2012 : Page-1409

2099 Al-Li Alloy Characterization by FE-SEM Joy, D.C., Ko, Y.U. & Hwu, J. ~ 2000 ! . Metrics of resolution and performance for CD-SEMs. Proc SPIE 3998 , 108. Kikuchi, N., Shinzawa, T., Negishi, T., Ogura, K. & Nielsen, C.H. ~ 2007 ! . Observation of crystalline contrast with using low energy electrons in SEM. Microsc Microanal 13 ~ Suppl 2 ! , 972–973. Kim, N.J. & Lee, E.W. ~ 1993 ! .Effect of T 1 precipitate on the anisotropy of Al-Li alloy 2090. Acta Metall Mater 41 ~ 3 ! , 941–948. Krivanek, O.L., Chisholm, M.F., Nicolosi, V. & Pennycook, T.J. ~ 2010 ! . Atom-by-atom structural and chemical analysis by an-nular dark-field electron microscopy. Nature 464 , 571–574. Leapman, R. ~ 2004 ! . EELS quantitative analysis. In Transmission Electron Energy Loss Spectroscopy in Materials Science and the EELS ATLAS , 2nd ed., Ahn, C.C. ~ Ed. ! , pp. 49–96. Weinheim, Germany: Wiley-VCH. Lich, B., Novak, L., Bosch, E., Stokes, D.J., Phifer, D.W. & Tuma, L. ~ 2010 ! . Angular backscatteredfiltering with an immer-sion lens SEM. Microsc Microanal 16 ~ Suppl2 ! , 402–403. Liu, J. ~ 2000 ! . Contrast ofhighly dispersed metal nanoparticles in high-resolution secondary electron andbackscattered electron images of supported metal catalysts. Microsc Microanal 6 , 388–399. Ma, Y., Zhou, X., Thompson, G.E., Hashimoto, T., Thomson, P. & Fowles, M. ~ 2011 ! . Distribution of intermetallics in an AA 2099-T8 aluminium alloy extrusion. Mater Chem Phys 126 , 46–53. Merli, P.G., Corticelli, F. & Morandi, V. ~ 2002 ! . Images of dopant profiles in low-energy scanning transmission electron microscopy. ApplPhysLett 81 ~ 24 ! ,4535–4537. Merli, P.G. & Morandi, V. ~ 2005 ! . Low-energy STEM of multi-layers and dopant profiles. Microsc Microanal 11 , 97–104. Morandi, V. & Merli, P.G. ~ 2007 ! . Scanning electron microscopy of thinned specimens: From multilayers to biological samples. Appl Phys Lett 90 , 163113-1–163113-3. Morandi, V., Merli, P.G. & Ferroni, M. ~ 2006 ! . Dopant regions imaging in scanning electron microscopy. J Appl Phys 99 , 043512-1–7. Munoz-Morris, M.A. & Morris, D.G. ~ 2010 ! . Severe platic defor-mation processing of Al-Cu-Li alloy for enhancing strength while maintaining ductibility. Scripta Mater 63 , 304–307. Nakagawa, M., Dunne, R., Koike, H.,Sato, M., Pérez-Camacho, J.J. & Kennedy, B.J. ~ 2002 ! . Low voltage FE-STEM for charac-terization of state-of-the-art silicon SRAM. J Electron Microsc 51 ~ 1 ! , 53–57. Newbury,D.E. ~ 1998 ! . Trace element detection at nanometer scale spatial resolution. J Electron Microsc 47 ~ 5 ! , 407–418. Newbury, D.E. ~ 2006 ! . The new X-ray mapping: X-ray spectrum imaging above 100 kHz output count rate with thesilicon drift detector. Micros Microanal 12 ,26–35. Newbury, D.E. ~ 2009 ! . Therevolution in energy dispersive X-ray spectrometry: Spectrum imaging at output count rates above 1 MHz with thesilicon drift detector on a scanning electron microscope. Spectroscopy 24 ~ 7 ! , 32–43. 1409 Pennycook, S.J. ~ 1989 ! . Z-contrast STEM for materials science. Ultramicroscopy 30 , 58–69. Pouchou, J.-L. ~ 2004 ! .Introduction à l’analyse EBSD: Principes Généraux et Mise en Œuvre dans un MEB. In L’analyse EBSD— Principes et applications . Pouchou, J.-L. ~ Ed. ! ,pp. 1–24. Les Ulis Cedex A, France: EDP Sciences—GN-MEBA. Probst, C., Gauvin, R. & Drew, R.A. ~ 2007 ! . Imaging of carbon nanotubes with tin-palladium particules using STEM detector in a FE-SEM. Micron 38 , 402–408. Reimer, L. ~ 1998 ! . Emission ofbackscattered and secondary elec-trons. In Scanning Electron Microscopy , 2nd ed., Reimer, L. ~ Ed. ! , pp. 135–169. Springer-Verlag. Richards, R.J., Owen, G.R. & Gwynn, I. ~ 1999 ! . Low voltage backscattered electron imaging ~, 5kv ! usingfield emission scanning electron microscopy. Scan Microsc 13 ~ 1 ! , 55–60. Rowlands, N., Holland, J. & Bhattiprolu, S. ~ 2009 ! . Largearea SDD detectors. Adv Mater Proc 167 ~ 5 ! , 41–43. Singh, A.K., Imam, M.A. & Sadananda, K. ~ 1988 ! . Artifacts introduced by ion milling in Al-Li-Cu alloys. J Electron Microsc Techniq 8 , 355–361. Steigerwald, M.D., Arnold, R., Bihr, J., Drexel, V., Jaksch, H., Preikszas, D. & Vermeulen, J.P. ~ 2004 ! .New detection system for GEMINI. Microsc Microanal 10 , 1372–1373. Terauchi, M.,Takahashi, H., Handa, N., Murano,T., Koike, M., Kawachi, T., Imazono, T., Koeda, M., Nagano, T., Sasai, H., Oue, Y., Yonezawa,Z. & Kuramoto,S. ~ 2012 ! .Ultrasoft-X-ray emission spectroscopy using a newly designed wavelength-dispersive spectrometer attached to a transmission electron microscope. J Electron Microsc 61 ~ 1 ! , 1–8. Unocic, K.A., Mills, M.J. & Daehn,G.S. ~ 2010 ! . Effect of gallium focused ion beam milling on preparation of aluminium thin foils. J Microsc 240 ~ 3 ! ,227–238. Ushiki,T., Hashizume, H., Itoh, S., Kuboki, K., Saito, S. & Tanaka, K. ~ 1998 ! . Low-voltage backscattered electron imaging of non-coatedbiological samples in a low-vacuum environ-ment using a variable-pressure scanning electron microscope with aYAG-detector. J Electron Microsc 47 ~ 4 ! ,351–354. von Harrach, H.S., Klenov, D.O., Freitag, B., Schlossmacher, P.,Collins, P.C. & Fraser,H.L. ~ 2010 ! . Comparison of the detection limits of EDS and EELS in S / TEM. Microsc Microanal 16 , 1312–1313. Wangyao, P., Zrnik, J., Kasl, J., Novy, Z. & Komolwit, P. ~ 2003 ! . The application of electron channelling contrast mode to study therecrystallization process in nickel alloy after different thermo-mechanical processing conditions. J Metals Mater Min 12 ~ 2 ! , 51–57. Washeed, A. & Lorimer, G.W. ~ 1997 ! .Dispersoids in Al-Li AA8090 series alloys. J Mater Sci 32 , 3341–3347. Wilkinson, A.J. & Hirsch, P.B. ~ 1997 ! . Electron diffraction based techniques in scanning electron microscopy ofbulk materials. Micron 28 ~ 4 ! ,279–308. Woo,K.D. & Kim,S.W. ~ 2002 ! .The mechanical properties and precipitation behavior of an Al-Cu-Li-~ In,Be ! alloy. J Mater Sci 37 , 411–416.

Previous Page  Next Page


Publication List
Using a screen reader? Click Here